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376.053 - Optical Metrology (VU 4.5ECTS)
Schitter, Georg
2024S
Schitter, Georg
Yoo, Han Woong
Hofbauer, Michael
Csencsics, Ernst Karl
Ojdanic, Denis
Buchner, Christoph

E376 Institute of Automation and Control
2023S
Schitter, Georg
Yoo, Han Woong
Csencsics, Ernst Karl
Hackl, Thomas
Ojdanic, Denis
Buchner, Christoph

E376 Institute of Automation and Control
2022S
Schitter, Georg
Yoo, Han Woong

E376 Institute of Automation and Control
2021S
Thurner, Thomas
Schitter, Georg
Yoo, Han Woong

E376 Institute of Automation and Control
2020S
Schitter, Georg
Yoo, Han Woong
Thurner, Thomas

E376 Institute of Automation and Control
2019S
Schitter, Georg
Thurner, Thomas
Yoo, Han Woong

E376 Institute of Automation and Control
2018S
Schitter, Georg
Thurner, Thomas
Yoo, Han Woong

E376 Institute of Automation and Control
2017S
Thurner, Thomas
Schitter, Georg
Yoo, Han Woong

E376 Institute of Automation and Control
2016S
Schitter, Georg
Thurner, Thomas
Saathof, Rudolf
Yoo, Han Woong

E376 Institute of Automation and Control
2015S
Thurner, Thomas
Schitter, Georg
Saathof, Rudolf

E376 Institute of Automation and Control
2014S
Thurner, Thomas
Schitter, Georg
Paris, Rene

E376 Institute of Automation and Control